A probe card is a substance that is used for large scale integrated circuit chip onto a wafer while testing the wafer process in large scale integrated circuit chip manufacturing. It is an interface found between the electronic test system and a semiconductor wafer. The wafer test process heavily depends on the probe cards accuracy.
There are many probe- card manufactures in the market. Probe card has many advantages. Probe card makes your task easier. To make your process easier, you should adopt the process of semiconductor manufacturing. As you all know that during the process of silicon production, there are lots of integrated circuits are active on a semiconductor wafer. Later the wafer will be diced and eliminated. Before the packaging process, circuits are examined in order to make them function well. The probe card is used to conduct an electrical test.
There are different types of advanced probe available in the industry. You can find a variety of probe cards. Each has something new to offer. Let take a glimpse of some advanced probe cards such as a vertical probe, U-probe, and MEMS-SP. Vertical probes are used to perform multi-die testing which is highly associated with general logic and microcomputers. The needles are placed vertically. It is the right option for a small pad and high-frequency wafers. U-probe is an ideal choice for the measurement of memory devices. U-probe uses only a single contact to fix contact with a wafer. That wafer is around 12 inches large. You can also scrub to get a satisfying result. You can also use it in any position onto the semiconductor wafer. Probe cards should be maintained periodically to bestow efficiency and performance. There are many pros to choosing MEMS technology. With the help of this advanced technology, you can use the probe card to test logic devices and microprocessors. It is one of the most advanced technologies for probe card in the market right now.
Semiconductors interrelated circuits are important in today’s highly-competitive world. it plays a very vital role in the final phase of the production procedure. It is also useful in testing and measuring the integrated circuits. For more information click here.